Please use this identifier to cite or link to this item: https://doi.org/10.1109/IECON.2004.1432212
DC FieldValue
dc.titleComparative study of PCA approaches in process monitoring and fault detection
dc.contributor.authorTien, D.X.
dc.contributor.authorLim, K.-W.
dc.contributor.authorJun, L.
dc.date.accessioned2014-06-19T03:03:07Z
dc.date.available2014-06-19T03:03:07Z
dc.date.issued2004
dc.identifier.citationTien, D.X.,Lim, K.-W.,Jun, L. (2004). Comparative study of PCA approaches in process monitoring and fault detection. IECON Proceedings (Industrial Electronics Conference) 3 : 2594-2599. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2004.1432212" target="_blank">https://doi.org/10.1109/IECON.2004.1432212</a>
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/69650
dc.description.abstractThis paper suggests an alternative scaling approach to PCA analysis for monitoring industrial processes. It also compares performance of the proposed moving PCA (MPCA) and three other PCA-based approaches including conventional PCA, adaptive PCA and exponentially weighted PCA, on a well known simulation model of an industrial plant and on data obtained from a petrochemical plant over a period of X months. The result showed that MPCA, which uses the mean and standard deviation of a moving window for scaling purpose, appeared to outperform the other three methods in monitoring processes with/without changes in operating conditions/set-points. While a conventional PCA seemed to work satisfactorily with the Tennessee Eastman Process (TEP) simulation, its performance was much poorer on the industrial data set. This comparison demonstrates that a degree of adaptation in scaling parameters is necessary for PCA-based approaches, especially for processes with multi operating modes. © 2004 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2004.1432212
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IECON.2004.1432212
dc.description.sourcetitleIECON Proceedings (Industrial Electronics Conference)
dc.description.volume3
dc.description.page2594-2599
dc.description.codenIEPRE
dc.identifier.isiutNOT_IN_WOS
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