Please use this identifier to cite or link to this item:
https://doi.org/10.1109/IECON.2004.1432212
DC Field | Value | |
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dc.title | Comparative study of PCA approaches in process monitoring and fault detection | |
dc.contributor.author | Tien, D.X. | |
dc.contributor.author | Lim, K.-W. | |
dc.contributor.author | Jun, L. | |
dc.date.accessioned | 2014-06-19T03:03:07Z | |
dc.date.available | 2014-06-19T03:03:07Z | |
dc.date.issued | 2004 | |
dc.identifier.citation | Tien, D.X.,Lim, K.-W.,Jun, L. (2004). Comparative study of PCA approaches in process monitoring and fault detection. IECON Proceedings (Industrial Electronics Conference) 3 : 2594-2599. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2004.1432212" target="_blank">https://doi.org/10.1109/IECON.2004.1432212</a> | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/69650 | |
dc.description.abstract | This paper suggests an alternative scaling approach to PCA analysis for monitoring industrial processes. It also compares performance of the proposed moving PCA (MPCA) and three other PCA-based approaches including conventional PCA, adaptive PCA and exponentially weighted PCA, on a well known simulation model of an industrial plant and on data obtained from a petrochemical plant over a period of X months. The result showed that MPCA, which uses the mean and standard deviation of a moving window for scaling purpose, appeared to outperform the other three methods in monitoring processes with/without changes in operating conditions/set-points. While a conventional PCA seemed to work satisfactorily with the Tennessee Eastman Process (TEP) simulation, its performance was much poorer on the industrial data set. This comparison demonstrates that a degree of adaptation in scaling parameters is necessary for PCA-based approaches, especially for processes with multi operating modes. © 2004 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2004.1432212 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/IECON.2004.1432212 | |
dc.description.sourcetitle | IECON Proceedings (Industrial Electronics Conference) | |
dc.description.volume | 3 | |
dc.description.page | 2594-2599 | |
dc.description.coden | IEPRE | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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