Please use this identifier to cite or link to this item:
https://doi.org/10.1109/IPFA.2009.5232596
| DC Field | Value | |
|---|---|---|
| dc.title | Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy | |
| dc.contributor.author | Tiedemann, A.-K. | |
| dc.contributor.author | Fakhri, M. | |
| dc.contributor.author | Heiderhoff, R. | |
| dc.contributor.author | Phang, J.C.H. | |
| dc.contributor.author | Balk, L.J. | |
| dc.date.accessioned | 2014-06-19T02:58:24Z | |
| dc.date.available | 2014-06-19T02:58:24Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Tiedemann, A.-K.,Fakhri, M.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J. (2009). Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 515-519. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2009.5232596" target="_blank">https://doi.org/10.1109/IPFA.2009.5232596</a> | |
| dc.identifier.isbn | 9781424439102 | |
| dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/69239 | |
| dc.description.abstract | Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the thermal-mechanical system are analyzed by introducing equivalent circuits for thermo-elastic transport mechanisms. Advanced failure analysis on degradation processes of interconnects can be performed by increasing temperature sensitivities and spatial resolutions. ©2009 IEEE. | |
| dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IPFA.2009.5232596 | |
| dc.source | Scopus | |
| dc.type | Conference Paper | |
| dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
| dc.description.doi | 10.1109/IPFA.2009.5232596 | |
| dc.description.sourcetitle | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | |
| dc.description.page | 515-519 | |
| dc.identifier.isiut | NOT_IN_WOS | |
| Appears in Collections: | Staff Publications | |
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