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https://doi.org/10.1063/1.1555333
DC Field | Value | |
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dc.title | Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system | |
dc.contributor.author | Li, K. | |
dc.contributor.author | Guo, Z. | |
dc.contributor.author | Han, G. | |
dc.contributor.author | Qiu, J. | |
dc.contributor.author | Wu, Y. | |
dc.date.accessioned | 2014-06-19T02:57:12Z | |
dc.date.available | 2014-06-19T02:57:12Z | |
dc.date.issued | 2003-05-15 | |
dc.identifier.citation | Li, K., Guo, Z., Han, G., Qiu, J., Wu, Y. (2003-05-15). Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system. Journal of Applied Physics 93 (10 2) : 6614-6616. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1555333 | |
dc.identifier.issn | 00218979 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/69135 | |
dc.description.abstract | Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system was investigated. The abnormal hysteresis loops were associated with two antiferromagnetic (AFM) phases formed due to interface diffusion after magnetic annealing. The exponential decay with temperature was due to complicated coupling mechanisms involved in the system. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1555333 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1063/1.1555333 | |
dc.description.sourcetitle | Journal of Applied Physics | |
dc.description.volume | 93 | |
dc.description.issue | 10 2 | |
dc.description.page | 6614-6616 | |
dc.description.coden | JAPIA | |
dc.identifier.isiut | 000182822300063 | |
Appears in Collections: | Staff Publications |
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