Please use this identifier to cite or link to this item:
https://doi.org/10.1109/ISEMC.2005.1513556
DC Field | Value | |
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dc.title | A novel integrated approach for simulation of electromagnetic susceptibility problem | |
dc.contributor.author | Jin, H.-F. | |
dc.contributor.author | Li, E.-P. | |
dc.contributor.author | Liu, E.-X. | |
dc.date.accessioned | 2014-06-19T02:55:21Z | |
dc.date.available | 2014-06-19T02:55:21Z | |
dc.date.issued | 2005 | |
dc.identifier.citation | Jin, H.-F.,Li, E.-P.,Liu, E.-X. (2005). A novel integrated approach for simulation of electromagnetic susceptibility problem. IEEE International Symposium on Electromagnetic Compatibility 2 : 446-450. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ISEMC.2005.1513556" target="_blank">https://doi.org/10.1109/ISEMC.2005.1513556</a> | |
dc.identifier.isbn | 0780393805 | |
dc.identifier.issn | 10774076 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/68971 | |
dc.description.abstract | This paper presents a systematic approach for electromagnetic susceptibility (EMS) analysis of high speed circuit with the presence of an electromagnetic interference. With numerical analysis, the effect of external electromagnetic noise on the interconnect is characterized and modeled as equivalent current source. At the same time, the marcomodel of internet subnetwork is constructed through Vector fitting method. Then, the resultant marcromodel and equivalent current source are ready to be synthesized into SPICE-compatible circuit simulator to efficiently expedite the transient analysis of the hybrid interconnects and lumped circuit elements with the external electromagnetic interference. Numerical example exhibit s that this systematic approach is a computationally efficient method to solve the electromagnetic susceptibility problems, in which the external electromagnetic interference effects are fully considered. © 2005 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/ISEMC.2005.1513556 | |
dc.source | Scopus | |
dc.subject | Electromagnetic susceptibility analysis | |
dc.subject | Equivalent current source | |
dc.subject | FDTD macromodel | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/ISEMC.2005.1513556 | |
dc.description.sourcetitle | IEEE International Symposium on Electromagnetic Compatibility | |
dc.description.volume | 2 | |
dc.description.page | 446-450 | |
dc.description.coden | IISPD | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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