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Please use this identifier to cite or link to this item: https://doi.org/10.1177/0142331208097837
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dc.titleTransactions of the Institute of Measurement and Control: Editorial
dc.contributor.authorLin, H.
dc.contributor.authorJi, Z.
dc.date.accessioned2014-06-18T07:11:47Z
dc.date.available2014-06-18T07:11:47Z
dc.date.issued2010-10
dc.identifier.citationLin, H., Ji, Z. (2010-10). Transactions of the Institute of Measurement and Control: Editorial. Transactions of the Institute of Measurement and Control 32 (5) : 443-444. ScholarBank@NUS Repository. https://doi.org/10.1177/0142331208097837
dc.identifier.issn01423312
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/68651
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1177/0142331208097837
dc.sourceScopus
dc.typeEditorial
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1177/0142331208097837
dc.description.sourcetitleTransactions of the Institute of Measurement and Control
dc.description.volume32
dc.description.issue5
dc.description.page443-444
dc.description.codenTICOD
dc.identifier.isiut000282321200001
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