Please use this identifier to cite or link to this item:
https://doi.org/10.1177/0142331208097837
DC Field | Value | |
---|---|---|
dc.title | Transactions of the Institute of Measurement and Control: Editorial | |
dc.contributor.author | Lin, H. | |
dc.contributor.author | Ji, Z. | |
dc.date.accessioned | 2014-06-18T07:11:47Z | |
dc.date.available | 2014-06-18T07:11:47Z | |
dc.date.issued | 2010-10 | |
dc.identifier.citation | Lin, H., Ji, Z. (2010-10). Transactions of the Institute of Measurement and Control: Editorial. Transactions of the Institute of Measurement and Control 32 (5) : 443-444. ScholarBank@NUS Repository. https://doi.org/10.1177/0142331208097837 | |
dc.identifier.issn | 01423312 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/68651 | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1177/0142331208097837 | |
dc.source | Scopus | |
dc.type | Editorial | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1177/0142331208097837 | |
dc.description.sourcetitle | Transactions of the Institute of Measurement and Control | |
dc.description.volume | 32 | |
dc.description.issue | 5 | |
dc.description.page | 443-444 | |
dc.description.coden | TICOD | |
dc.identifier.isiut | 000282321200001 | |
Appears in Collections: | Staff Publications |
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