Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2141649
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dc.titleNonvolatile phase change memory nanocell fabrication by femtosecond laser writing assisted with near-field optical microscopy
dc.contributor.authorWang, W.J.
dc.contributor.authorZhao, R.
dc.contributor.authorShi, L.P.
dc.contributor.authorMiao, X.S.
dc.contributor.authorTan, P.K.
dc.contributor.authorHong, M.H.
dc.contributor.authorChong, T.C.
dc.contributor.authorWu, Y.H.
dc.contributor.authorLin, Y.
dc.date.accessioned2014-06-18T06:12:26Z
dc.date.available2014-06-18T06:12:26Z
dc.date.issued2005
dc.identifier.citationWang, W.J., Zhao, R., Shi, L.P., Miao, X.S., Tan, P.K., Hong, M.H., Chong, T.C., Wu, Y.H., Lin, Y. (2005). Nonvolatile phase change memory nanocell fabrication by femtosecond laser writing assisted with near-field optical microscopy. Journal of Applied Physics 98 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2141649
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/68355
dc.description.abstractThe phase change memory cells were developed by using a combination system of a femtosecond laser with near-field scanning optical microscopy. The memory cells with feature size varying from 800 nm down to 90 nm were achieved. The cell functional performances were tested, and the scalability of the programming current as a function of the memory cell features was investigated. The optical near-field distance which is one of the critical factors to achieve high resolution nanostructures was studied experimentally with the consideration of the whole fabrication process for functional devices. The Bethe-Bouwkamp model was employed to study the effects of the optical near-field distance to the nanostructure geometry. The programming current of 0.8 mA was observed for the memory nanocell at a feature size of 90 nm. © 2005 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2141649
dc.sourceScopus
dc.typeReview
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.2141649
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume98
dc.description.issue12
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000234339700066
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