Please use this identifier to cite or link to this item: https://doi.org/10.1002/adma.200501138
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dc.titleMulticolor photoluminescence from porous silicon using focused, high-energy helium ions
dc.contributor.authorTeo, E.J.
dc.contributor.authorBreese, M.B.H.
dc.contributor.authorBettiol, A.A.
dc.contributor.authorMangaiyarkarasi, D.
dc.contributor.authorChampeaux, F.
dc.contributor.authorWatt, F.
dc.contributor.authorBlackwood, D.J.
dc.date.accessioned2014-06-18T06:12:08Z
dc.date.available2014-06-18T06:12:08Z
dc.date.issued2006-01-05
dc.identifier.citationTeo, E.J., Breese, M.B.H., Bettiol, A.A., Mangaiyarkarasi, D., Champeaux, F., Watt, F., Blackwood, D.J. (2006-01-05). Multicolor photoluminescence from porous silicon using focused, high-energy helium ions. Advanced Materials 18 (1) : 51-55. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200501138
dc.identifier.issn09359648
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/68325
dc.description.abstractThe ability to controllably red-shift the wavelength of the photoluminescence (PL) from patterned areas of p-type porous silicon over 150 nm in the visible spectrum, was demonstrated. This was achieved by pre-irradiating the silicon with a focused 2 MeV helium-ion-beam, resulting in lattice damage which increases the resistivity and reduces the current flowing. The gradual red-shift of the PL emission with dose is accompanied by an increase in nanocrystal size as a result of lower hole current through the damaged regions. The results show that oxidation-related mechanisms may-redshift the PL emission when thermally or chemically oxidized.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/adma.200501138
dc.sourceScopus
dc.typeReview
dc.contributor.departmentPHYSICS
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1002/adma.200501138
dc.description.sourcetitleAdvanced Materials
dc.description.volume18
dc.description.issue1
dc.description.page51-55
dc.description.codenADVME
dc.identifier.isiut000234657500008
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