Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevB.44.10461
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dc.titleX-ray photoelectron spectroscopic studies of poly(2,2-bithiophene) and its complexes
dc.contributor.authorKang, E.T.
dc.contributor.authorNeoh, K.G.
dc.contributor.authorTan, K.L.
dc.date.accessioned2014-06-17T10:03:06Z
dc.date.available2014-06-17T10:03:06Z
dc.date.issued1991
dc.identifier.citationKang, E.T., Neoh, K.G., Tan, K.L. (1991). X-ray photoelectron spectroscopic studies of poly(2,2-bithiophene) and its complexes. Physical Review B 44 (19) : 10461-10469. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.44.10461
dc.identifier.issn01631829
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/67607
dc.description.abstractThe charge distributions in chemically synthesized poly(2,2-bithiophene) (PBT) complexes have been studied by x-ray photoelectron spectroscopy (XPS). XPS results suggest the presence of multiple chemical states for the dopants in perchlorate, iodide, and FeCl4- complexes. Properly curve-fitted C 1s and S 2p core-level spectra reveal the simultaneous presence of neutral and polarized (or partially charged) species in both carbon and sulfur. The relative amounts of the neutral and polarized species vary in accordance with the oxidation level of the polymer. These results suggest that each dopant anion is associated with a thiophenium ion in the polymer chain. Similar results are also observed for the poly(3-methylthiophene) complexes. The present XPS results differ from most of the earlier XPS studies that have reported overall binding-energy shifts for the C 1s and/or S 2p core-level spectra of the oxidized thiophene polymer complexes. The undoped PBT is susceptible to reoxidation by iodine, ferric chloride, and strong organic acceptors, such as 2,3-dichloro-5,6-dicyano-p- benzoquinone and tetracyanoethylene. © 1991 The American Physical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1103/PhysRevB.44.10461
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentCHEMICAL ENGINEERING
dc.contributor.departmentPHYSICS
dc.description.doi10.1103/PhysRevB.44.10461
dc.description.sourcetitlePhysical Review B
dc.description.volume44
dc.description.issue19
dc.description.page10461-10469
dc.identifier.isiutA1991GP68900005
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