Please use this identifier to cite or link to this item: https://doi.org/10.1088/1464-4258/10/3/033001
DC FieldValue
dc.titleLocalization measures for high-aperture wavefields based on pupil moments
dc.contributor.authorSheppard, C.J.R.
dc.contributor.authorAlonso, M.A.
dc.contributor.authorMoore, N.J.
dc.date.accessioned2014-06-17T09:44:55Z
dc.date.available2014-06-17T09:44:55Z
dc.date.issued2008-03-01
dc.identifier.citationSheppard, C.J.R., Alonso, M.A., Moore, N.J. (2008-03-01). Localization measures for high-aperture wavefields based on pupil moments. Journal of Optics A: Pure and Applied Optics 10 (3) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/1464-4258/10/3/033001
dc.identifier.issn14644258
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/67139
dc.description.abstractA variety of different measures for the localization of high-aperture scalar wavefields, based on the moments of the pupil, are compared. These are applied to particular examples such as Gaussian beams in the complex focus model, and aplanatic and Herschel focusing systems. These measures can be used to investigate focusing properties of different optical systems, and the use of apodizers and super-resolving masks. The optimum apodizer for achieving minimum axial second moment width is investigated. © IOP Publishing Ltd.
dc.sourceScopus
dc.subjectApodization
dc.subjectBeam-shaping
dc.subjectBeams
dc.subjectDiffraction
dc.subjectFocusing
dc.subjectSuper-resolution
dc.typeArticle
dc.contributor.departmentBIOENGINEERING
dc.description.doi10.1088/1464-4258/10/3/033001
dc.description.sourcetitleJournal of Optics A: Pure and Applied Optics
dc.description.volume10
dc.description.issue3
dc.description.page-
dc.description.codenJOAOF
dc.identifier.isiut000254152100001
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.