Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-4484/19/25/255607
DC FieldValue
dc.titleEffect of ion bombardment on the synthesis of vertically aligned single-walled carbon nanotubes by plasma-enhanced chemical vapor deposition
dc.contributor.authorLuo, Z.
dc.contributor.authorLim, S.
dc.contributor.authorYou, Y.
dc.contributor.authorMiao, J.
dc.contributor.authorGong, H.
dc.contributor.authorZhang, J.
dc.contributor.authorWang, S.
dc.contributor.authorLin, J.
dc.contributor.authorShen, Z.
dc.date.accessioned2014-06-17T07:58:14Z
dc.date.available2014-06-17T07:58:14Z
dc.date.issued2008-06-25
dc.identifier.citationLuo, Z., Lim, S., You, Y., Miao, J., Gong, H., Zhang, J., Wang, S., Lin, J., Shen, Z. (2008-06-25). Effect of ion bombardment on the synthesis of vertically aligned single-walled carbon nanotubes by plasma-enhanced chemical vapor deposition. Nanotechnology 19 (25) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-4484/19/25/255607
dc.identifier.issn09574484
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/64851
dc.description.abstractThe synthesis of vertically aligned single-walled carbon nanotubes (VA-SWNTs) by plasma-enhanced chemical vapor deposition (PECVD) was achieved at 500-600°C, using ethylene as the carbon source and 1 nm Fe film as the catalyst. For growth of high-quality VA-SWNTs in a plasma sheath, it is crucial to alleviate the undesirable ion bombardment etching effects by the optimization of plasma input power and gas pressure. The resistibility of synthesized VA-SWNTs against ion bombardment etching was found to be closely related to the growth temperature. At relatively low temperature (500°C), the VA-SWNTs were very susceptible to ion bombardments, which could induce structural defects, and even resulted in a structural transition to few-walled nanotubes. For capacitively coupled radio frequency (rf) PECVD operating at moderate gas pressure (0.3-10 Torr), the ion bombardment etching effect is mainly dependent on the ion flux, which is related to the plasma input power and gas pressure. © IOP Publishing Ltd.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1088/0957-4484/19/25/255607
dc.description.sourcetitleNanotechnology
dc.description.volume19
dc.description.issue25
dc.description.page-
dc.description.codenNNOTE
dc.identifier.isiut000256455800017
Appears in Collections:Staff Publications

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