Please use this identifier to cite or link to this item:
https://doi.org/10.1088/0957-4484/19/25/255607
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dc.title | Effect of ion bombardment on the synthesis of vertically aligned single-walled carbon nanotubes by plasma-enhanced chemical vapor deposition | |
dc.contributor.author | Luo, Z. | |
dc.contributor.author | Lim, S. | |
dc.contributor.author | You, Y. | |
dc.contributor.author | Miao, J. | |
dc.contributor.author | Gong, H. | |
dc.contributor.author | Zhang, J. | |
dc.contributor.author | Wang, S. | |
dc.contributor.author | Lin, J. | |
dc.contributor.author | Shen, Z. | |
dc.date.accessioned | 2014-06-17T07:58:14Z | |
dc.date.available | 2014-06-17T07:58:14Z | |
dc.date.issued | 2008-06-25 | |
dc.identifier.citation | Luo, Z., Lim, S., You, Y., Miao, J., Gong, H., Zhang, J., Wang, S., Lin, J., Shen, Z. (2008-06-25). Effect of ion bombardment on the synthesis of vertically aligned single-walled carbon nanotubes by plasma-enhanced chemical vapor deposition. Nanotechnology 19 (25) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-4484/19/25/255607 | |
dc.identifier.issn | 09574484 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/64851 | |
dc.description.abstract | The synthesis of vertically aligned single-walled carbon nanotubes (VA-SWNTs) by plasma-enhanced chemical vapor deposition (PECVD) was achieved at 500-600°C, using ethylene as the carbon source and 1 nm Fe film as the catalyst. For growth of high-quality VA-SWNTs in a plasma sheath, it is crucial to alleviate the undesirable ion bombardment etching effects by the optimization of plasma input power and gas pressure. The resistibility of synthesized VA-SWNTs against ion bombardment etching was found to be closely related to the growth temperature. At relatively low temperature (500°C), the VA-SWNTs were very susceptible to ion bombardments, which could induce structural defects, and even resulted in a structural transition to few-walled nanotubes. For capacitively coupled radio frequency (rf) PECVD operating at moderate gas pressure (0.3-10 Torr), the ion bombardment etching effect is mainly dependent on the ion flux, which is related to the plasma input power and gas pressure. © IOP Publishing Ltd. | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | MATERIALS SCIENCE AND ENGINEERING | |
dc.description.doi | 10.1088/0957-4484/19/25/255607 | |
dc.description.sourcetitle | Nanotechnology | |
dc.description.volume | 19 | |
dc.description.issue | 25 | |
dc.description.page | - | |
dc.description.coden | NNOTE | |
dc.identifier.isiut | 000256455800017 | |
Appears in Collections: | Staff Publications |
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