Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/62338
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dc.titleIntegrated FDTD analysis of active microwave circuits and solid state devices
dc.contributor.authorHum, P.J.
dc.contributor.authorLeong, M.S.
dc.contributor.authorLeong, H.C.
dc.date.accessioned2014-06-17T06:49:58Z
dc.date.available2014-06-17T06:49:58Z
dc.date.issued1999
dc.identifier.citationHum, P.J.,Leong, M.S.,Leong, H.C. (1999). Integrated FDTD analysis of active microwave circuits and solid state devices. Asia-Pacific Microwave Conference Proceedings, APMC 2 : 405-408. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/62338
dc.description.abstractAn active device model is devised and coupled with the FDTD scheme for the analysis of electromagnetic effects on solid-state devices. The device model is based on the numerical solutions of semiconductor transport equations of the device. In this work, a Newton iterative method is used to solve the equations instead of employing the conventional Gummel's method as in [1]. This method is found to be much faster than the Gummel's method in terms of computational time and convergence of the solutions, which can usually be achieved within three to four iterations. An example that simulates the transient response of a diode employing this resultant scheme is presented and the results are compared with that using the conventional lumped-element approach for active device. An application example, which simulates a single-pole double-throw (SPDT) switch using the device model proposed, is also analyzed.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentCENTRE FOR WIRELESS COMMUNICATIONS
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleAsia-Pacific Microwave Conference Proceedings, APMC
dc.description.volume2
dc.description.page405-408
dc.description.coden00280
dc.identifier.isiutNOT_IN_WOS
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