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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/62112
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dc.titleEfficient method for parametric yield gradient estimation
dc.contributor.authorWu, Ting
dc.contributor.authorFoo, Say Wei
dc.date.accessioned2014-06-17T06:47:32Z
dc.date.available2014-06-17T06:47:32Z
dc.date.issued1999
dc.identifier.citationWu, Ting,Foo, Say Wei (1999). Efficient method for parametric yield gradient estimation. Proceedings - IEEE International Symposium on Circuits and Systems 1 : I-419. ScholarBank@NUS Repository.
dc.identifier.isbn0780354729
dc.identifier.issn02714310
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/62112
dc.description.abstractA novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleProceedings - IEEE International Symposium on Circuits and Systems
dc.description.volume1
dc.description.pageI-419
dc.description.codenPICSD
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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