Please use this identifier to cite or link to this item: https://doi.org/10.1364/AO.48.001990
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dc.titleVibration measurement of a miniature component by high-speed image-plane digital holographic microscopy
dc.contributor.authorYu, F.
dc.contributor.authorHongjian, S.
dc.contributor.authorHong, M.
dc.date.accessioned2014-06-17T06:37:58Z
dc.date.available2014-06-17T06:37:58Z
dc.date.issued2009-04-10
dc.identifier.citationYu, F., Hongjian, S., Hong, M. (2009-04-10). Vibration measurement of a miniature component by high-speed image-plane digital holographic microscopy. Applied Optics 48 (11) : 1990-1997. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.48.001990
dc.identifier.issn00036935
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/61672
dc.description.abstractMeasuring deformation of vibrating specimens whose dimensions are in the submillimeter range introduces a number of difficulties using laser interferometry. Normal interferometry is not suitable because of a phase ambiguity problem. In addition, the noise effect is much more serious in the measurement of small objects because a high-magnification lens is used. We present a method for full-field measurement of displacement, velocity, and acceleration of a vibrating miniature object based on image-plane digital holographic microscopy. A miniature cantilever beam is excited by a piezoelectric transducer stage with a sinusoidal configuration. A sequence of digital holograms is captured using a high-speed digital holographic microscope. Windowed Fourier analysis is applied in the spatial and spatiotemporal domains to extract the displacement, velocity and acceleration. The result shows that a combination of image- plane digital holographic microscopy and windowed Fourier analyses can be used to study vibration without encountering a phase ambiguity problem, and one can obtain instantaneous kinematic parameters on each point. ©2009 Optical Society of America.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1364/AO.48.001990
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1364/AO.48.001990
dc.description.sourcetitleApplied Optics
dc.description.volume48
dc.description.issue11
dc.description.page1990-1997
dc.description.codenAPOPA
dc.identifier.isiut000265620000004
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