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https://doi.org/10.1021/am301220h
DC Field | Value | |
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dc.title | Bipolar charge storage characteristics in copper and cobalt co-doped zinc oxide (ZnO) thin film | |
dc.contributor.author | Kumar, A. | |
dc.contributor.author | Herng, T.S. | |
dc.contributor.author | Zeng, K. | |
dc.contributor.author | Ding, J. | |
dc.date.accessioned | 2014-06-17T06:13:53Z | |
dc.date.available | 2014-06-17T06:13:53Z | |
dc.date.issued | 2012-10-24 | |
dc.identifier.citation | Kumar, A., Herng, T.S., Zeng, K., Ding, J. (2012-10-24). Bipolar charge storage characteristics in copper and cobalt co-doped zinc oxide (ZnO) thin film. ACS Applied Materials and Interfaces 4 (10) : 5276-5280. ScholarBank@NUS Repository. https://doi.org/10.1021/am301220h | |
dc.identifier.issn | 19448244 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/59644 | |
dc.description.abstract | The bipolar charge phenomenon in Cu and Co co-doped zinc oxide (ZnO) film samples has been studied using scanning probe microscopy (SPM) techniques. Those ZnO samples are made using a pulsed laser deposition (PLD) technique. It is found that the addition of Cu and Co dopants suppresses the electron density in ZnO and causes a significant change in the work function (Fermi level) value of the ZnO film; this results in the ohmic nature of the contact between the electrode (probe tip) and codoped sample, whereas this contact exhibits a Schottky nature in the undoped and single-element-doped samples. These results are verified by Kelvin probe force microscopy (KPFM) and ultraviolet photoelectron spectroscopy (UPS) measurements. It is also found that the co-doping (Cu and Co) can stabilize the bipolar charge, whereas Cu doping only stabilizes the positive charge in ZnO thin films. © 2012 American Chemical Society. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/am301220h | |
dc.source | Scopus | |
dc.subject | bipolar charge | |
dc.subject | charge stability | |
dc.subject | codoped ZnO | |
dc.subject | Kelvin probe force microscopy | |
dc.subject | zinc oxide | |
dc.type | Article | |
dc.contributor.department | MATERIALS SCIENCE AND ENGINEERING | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.description.doi | 10.1021/am301220h | |
dc.description.sourcetitle | ACS Applied Materials and Interfaces | |
dc.description.volume | 4 | |
dc.description.issue | 10 | |
dc.description.page | 5276-5280 | |
dc.identifier.isiut | 000310109000031 | |
Appears in Collections: | Staff Publications |
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