Please use this identifier to cite or link to this item: https://doi.org/10.1080/14786430601032386
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dc.titleAdsorption characteristics of parent and copper-sputtered RD silica gels
dc.contributor.authorSaha, B.B.
dc.contributor.authorChakraborty, A.
dc.contributor.authorKoyama, S.
dc.contributor.authorLee, J.-B.
dc.contributor.authorHe, J.
dc.contributor.authorNg, K.C.
dc.date.accessioned2014-06-17T06:10:45Z
dc.date.available2014-06-17T06:10:45Z
dc.date.issued2007-03
dc.identifier.citationSaha, B.B., Chakraborty, A., Koyama, S., Lee, J.-B., He, J., Ng, K.C. (2007-03). Adsorption characteristics of parent and copper-sputtered RD silica gels. Philosophical Magazine 87 (7) : 1113-1121. ScholarBank@NUS Repository. https://doi.org/10.1080/14786430601032386
dc.identifier.issn14786435
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/59379
dc.description.abstractSurface modification of type RD silica gel was achieved by depositing layers of thin-film copper on the parent silica gel surfaces so as to improve their performances, circumventing the poor thermal conductivity of the adsorbent. Porous properties (surface area, pore size and volume) were determined using nitrogen adsorption/desorption isotherm measurements, which were performed on adsorbents for both parent and Cu-sputtered silica gels in liquid nitrogen at a temperature of 77.4K. The copper sputtering experiments were conducted in a chamber of inert argon gas where the chamber was bombarded with a radio frequency (RF) of 13.56MHz. The comparative performance of the parent and Cu-sputtered silica gels was determined via various key measurements such the Brunauer-Emmett-Teller (BET), the Horvath and Kawazoe (HK) and the hot-disc sensor methods.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1080/14786430601032386
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1080/14786430601032386
dc.description.sourcetitlePhilosophical Magazine
dc.description.volume87
dc.description.issue7
dc.description.page1113-1121
dc.identifier.isiut000244687300011
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