Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3690139
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dc.titleThe role of Mg interface layer in MgO magnetic tunnel junctions with CoFe and CoFeB electrodes
dc.contributor.authorYang, H.
dc.contributor.authorYang, S.-H.
dc.contributor.authorParkin, S.
dc.date.accessioned2014-06-17T03:08:28Z
dc.date.available2014-06-17T03:08:28Z
dc.date.issued2012
dc.identifier.citationYang, H., Yang, S.-H., Parkin, S. (2012). The role of Mg interface layer in MgO magnetic tunnel junctions with CoFe and CoFeB electrodes. AIP Advances 2 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3690139
dc.identifier.issn21583226
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57636
dc.description.abstractThe tunneling spin polarization (TSP) is directly measured from reactively sputter deposited crystalline MgO tunnel barriers with various CoFe(B) compositions using superconducting tunneling spectroscopy.We find that theMg interface layer thickness dependence of TSP values for CoFeB/Mg/MgO junctions is substantially different from those for CoFe/Mg/MgO especially in the pre-annealed samples due to the formation of boron oxide at the CoFeB/MgO interface. Annealing depletes boron at the interface thus requiring a finite Mg interface layer to prevent CoFeOx formation at the CoFeB/MgO interface so that the TSP values can be optimized by controlling Mg thickness. © 2012 Author(s).
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3690139
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.3690139
dc.description.sourcetitleAIP Advances
dc.description.volume2
dc.description.issue1
dc.description.page-
dc.identifier.isiut000302225400068
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