Please use this identifier to cite or link to this item: https://doi.org/10.1109/JLT.2008.928540
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dc.titleResidual admission capacity in optical burst switching networks and its application in configuration of loss guaranteed tunnels
dc.contributor.authorChen, Q.
dc.contributor.authorMohan, G.
dc.contributor.authorChua, K.-C.
dc.date.accessioned2014-06-17T03:04:05Z
dc.date.available2014-06-17T03:04:05Z
dc.date.issued2009-07-01
dc.identifier.citationChen, Q., Mohan, G., Chua, K.-C. (2009-07-01). Residual admission capacity in optical burst switching networks and its application in configuration of loss guaranteed tunnels. Journal of Lightwave Technology 27 (13) : 2544-2551. ScholarBank@NUS Repository. https://doi.org/10.1109/JLT.2008.928540
dc.identifier.issn07338724
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57254
dc.description.abstractThis paper studies how the capacity utilization can be improved by proper configuration of loss guaranteed tunnels in optical burst switching (OBS) networks.We show that the method of computing residual bandwidth in IP networks is not applicable to OBS networks due to the bufferless nature.We propose a more accurate metric, residual admission capacity (RAC), to measure the amount of link residual capacity. We apply the concept of RAC in loss budget partitioning and loss threshold selection. First, we develop an RAC based loss budget partitioning (RAC-LBP) algorithm. The RAC-LBP is efficient in capacity utilization and flexible with loss threshold settings. We then develop an RAC based loss threshold selection (RAC-LTS) algorithm. Using the loss thresholds determined by the RAC-LTS can improve the capacity utilization efficiency. © 2009 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/JLT.2008.928540
dc.sourceScopus
dc.subjectLoss budget partition
dc.subjectLoss threshold selection
dc.subjectOptical burst switching
dc.subjectResidual admission capacity
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/JLT.2008.928540
dc.description.sourcetitleJournal of Lightwave Technology
dc.description.volume27
dc.description.issue13
dc.description.page2544-2551
dc.description.codenJLTED
dc.identifier.isiut000267994200032
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