Please use this identifier to cite or link to this item: https://doi.org/10.1177/0142331209339868
DC FieldValue
dc.titleModal parametric identification of flexible mechanical structures in mechatronic systems
dc.contributor.authorPang, C.K.
dc.contributor.authorLewis, F.L.
dc.contributor.authorLee, T.H.
dc.date.accessioned2014-06-17T02:57:03Z
dc.date.available2014-06-17T02:57:03Z
dc.date.issued2010-04
dc.identifier.citationPang, C.K., Lewis, F.L., Lee, T.H. (2010-04). Modal parametric identification of flexible mechanical structures in mechatronic systems. Transactions of the Institute of Measurement and Control 32 (2) : 137-154. ScholarBank@NUS Repository. https://doi.org/10.1177/0142331209339868
dc.identifier.issn01423312
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56653
dc.description.abstractTo shorten the development and production time of mechatronic systems, an integrated servo-mechanical design procedure combining mechanical structure prototyping and fast servo evaluation is essential. In this paper, a modal parametric identification procedure is developed for estimation of residues, damping ratios, and natural frequencies of resonant modes for linear-time-invariant flexible mechanical systems. The coefficients and residues of the transfer function model are optimized via two subsequent least squares error optimization criteria in modal summation form. The proposed methodology is verified with experimental frequency responses measured from a commercial dual-stage hard disk drive using a laser Doppler vibrometer. Our results show the effectiveness and robustness of the proposed system identification algorithm for estimating the modal parameters of flexible mechanical structures in mechatronic systems. © 2010 The Institute of Measurement and Control.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1177/0142331209339868
dc.sourceScopus
dc.subjectHard disk drives (HDDs)
dc.subjectLeast squares error
dc.subjectMechatronic systems
dc.subjectModal parameters
dc.subjectSystem identification
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1177/0142331209339868
dc.description.sourcetitleTransactions of the Institute of Measurement and Control
dc.description.volume32
dc.description.issue2
dc.description.page137-154
dc.description.codenTICOD
dc.identifier.isiut000277306400003
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