Please use this identifier to cite or link to this item: https://doi.org/10.1002/mmce.20125
Title: Frequency-dependent maximum average power-handling capabilities of single and edge-coupled microstrip lines on low-Temperature co-fired ceramic (LTCC) substrates
Authors: Yin, W.-Y. 
Dong, X.
Gan, Y.B.
Keywords: Losses
Low-temperature co-fired ceramics (ltccs)
Maximum average power-handling capability
Pulse responses
Single and edge-coupled microstrip lines
Temperature rise
Thermal model
Issue Date: Mar-2006
Citation: Yin, W.-Y., Dong, X., Gan, Y.B. (2006-03). Frequency-dependent maximum average power-handling capabilities of single and edge-coupled microstrip lines on low-Temperature co-fired ceramic (LTCC) substrates. International Journal of RF and Microwave Computer-Aided Engineering 16 (2) : 103-117. ScholarBank@NUS Repository. https://doi.org/10.1002/mmce.20125
Abstract: The frequency-dependent maximum average power-handling capabilities (APHCs) of single and edge-coupled microstrip lines (MLs) on low-temperature co-fired ceramic (LTCC) substrates are investigated in this article. Although LTCCs have excellent high-frequency performance, the thermal conductivity is about 2.0-3.0 W/m°C, which is much smaller than that of sapphires, alumina, silicon, and GaAs. The method used to predict the APHC is based on the calculated conductive and dielectric attenuation constants for different modes, and the proposed multilayer thermal model for the temperature rise. Numerical investigations are carried out to examine the effects of geometric and physical parameters on the wideband pulse responses and maximum APHC for single finite-ground thin-film and coupled MLs, respectively. Methodologies to enhance the power-handling capability which are useful in the design of high-density microstrip interconnects on or embedded in multi-layer LTCCs are proposed. © 2005 Wiley Periodicals, Inc.
Source Title: International Journal of RF and Microwave Computer-Aided Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/56093
ISSN: 10964290
DOI: 10.1002/mmce.20125
Appears in Collections:Staff Publications

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