Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jmmm.2013.11.044
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dc.titleElectrical and proximity-magnetic effects induced quantum Goos-Hänchen shift on the surface of topological insulator
dc.contributor.authorKuai, J.
dc.contributor.authorDa, H.X.
dc.date.accessioned2014-06-17T02:47:26Z
dc.date.available2014-06-17T02:47:26Z
dc.date.issued2014-03
dc.identifier.citationKuai, J., Da, H.X. (2014-03). Electrical and proximity-magnetic effects induced quantum Goos-Hänchen shift on the surface of topological insulator. Journal of Magnetism and Magnetic Materials 354 : 355-358. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmmm.2013.11.044
dc.identifier.issn03048853
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55815
dc.description.abstractWe use scattering matrix method to theoretically demonstrate that the quantum Goos-Hänchen shift of the surface on three-dimensional topological insulator coated by ferromagnetic strips is sensitive to the magnitude of ferromagnetic magnetization. The dependence of quantum Goos-Hänchen shift on magnetization and gate bias is investigated by performing station phase approach. It is found that quantum Goos-Hänchen shift is positive and large under the magnetic barrier but may be positive as well as negative values under the gate bias. Furthermore, the position of quantum Goos-Hänchen peak can also be modulated by the combination of gate bias and proximity magnetic effects. Our results indicate that topological insulators are another candidates to support quantum Goos-Hänchen shift. © 2013 Elsevier B.V.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jmmm.2013.11.044
dc.sourceScopus
dc.subjectFerromagnetic magnetization
dc.subjectGate bias
dc.subjectQuantum Goos-Hänchen shift
dc.subjectTopological insulator
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.jmmm.2013.11.044
dc.description.sourcetitleJournal of Magnetism and Magnetic Materials
dc.description.volume354
dc.description.page355-358
dc.description.codenJMMMD
dc.identifier.isiut000329109300059
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