Please use this identifier to cite or link to this item:
https://doi.org/10.1049/ip-smt:20045036
DC Field | Value | |
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dc.title | Classification of partial discharge events in gas-insulated substations using wavelet packet transform and neural network approaches | |
dc.contributor.author | Jin, J. | |
dc.contributor.author | Chang, C.S. | |
dc.contributor.author | Chang, C. | |
dc.contributor.author | Hoshino, T. | |
dc.contributor.author | Hanai, M. | |
dc.contributor.author | Kobayashi, N. | |
dc.date.accessioned | 2014-06-17T02:41:31Z | |
dc.date.available | 2014-06-17T02:41:31Z | |
dc.date.issued | 2006-03 | |
dc.identifier.citation | Jin, J., Chang, C.S., Chang, C., Hoshino, T., Hanai, M., Kobayashi, N. (2006-03). Classification of partial discharge events in gas-insulated substations using wavelet packet transform and neural network approaches. IEE Proceedings: Science, Measurement and Technology 153 (2) : 55-63. ScholarBank@NUS Repository. https://doi.org/10.1049/ip-smt:20045036 | |
dc.identifier.issn | 13502344 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/55302 | |
dc.description.abstract | To ensure the safe and reliable operation of a gas-insulated substation (GIS), it is crucial to quickly identify partial discharge (PD) sources to prevent the occurrance of breakdowns. A method based on wavelet packet transform techniques is developed to meet this requirement. The proposed method extracts is able to extract features from ultra-high frequency resonance signals measured from a test GIS section. These features are subsequently used to train a neural network that is then able to quickly and reliably diagnose PD events. A quality-assurance scheme is developed that ensures the robustness of the PD classification to changes in the background noise level and the location of the PD event within the test GIS section. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1049/ip-smt:20045036 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1049/ip-smt:20045036 | |
dc.description.sourcetitle | IEE Proceedings: Science, Measurement and Technology | |
dc.description.volume | 153 | |
dc.description.issue | 2 | |
dc.description.page | 55-63 | |
dc.description.coden | ISMTE | |
dc.identifier.isiut | 000236607800002 | |
Appears in Collections: | Staff Publications |
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