Please use this identifier to cite or link to this item: https://doi.org/10.1109/TBME.2008.918563
DC FieldValue
dc.titleAnalysis of fMRI data with drift: Modified general linear model and Bayesian estimator
dc.contributor.authorLuo, H.
dc.contributor.authorPuthusserypady, S.
dc.date.accessioned2014-06-17T02:38:57Z
dc.date.available2014-06-17T02:38:57Z
dc.date.issued2008-05
dc.identifier.citationLuo, H., Puthusserypady, S. (2008-05). Analysis of fMRI data with drift: Modified general linear model and Bayesian estimator. IEEE Transactions on Biomedical Engineering 55 (5) : 1504-1511. ScholarBank@NUS Repository. https://doi.org/10.1109/TBME.2008.918563
dc.identifier.issn00189294
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55081
dc.description.abstractThe slowly varying drift poses a major problem in the analysis of functional magnetic resonance imaging (fMRI) data. In this paper, based on the observation that noise in fMRI is long memory fractional noise and the slowly varying drift resides in a subspace spanned only by large scale wavelets, we examine a modified general linear model (GLM) in wavelet domain under Bayesian framework. This modified model estimates the activation parameters at each scale of wavelet decomposition. Then, a model selection criterion based on the results from the modified scheme is proposed to model the drift. Results obtained from simulated as well as real fMRI data show that the proposed Bayesian estimator can accurately capture the noise structure, and hence, result in robust estimation of the parameters in GLM. Besides, the proposed model selection criterion works well and could efficiently remove the drift. © 2006 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TBME.2008.918563
dc.sourceScopus
dc.subjectBayesian estimator
dc.subjectFractional noise
dc.subjectFunctional magnetic resonance imaging (fMRI)
dc.subjectGeneral linear model (GLM)
dc.subjectModel selection
dc.subjectWavelet decomposition
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TBME.2008.918563
dc.description.sourcetitleIEEE Transactions on Biomedical Engineering
dc.description.volume55
dc.description.issue5
dc.description.page1504-1511
dc.description.codenIEBEA
dc.identifier.isiut000255148600005
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