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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1529301
DC FieldValue
dc.titleAdd-on transmission attachments for the scanning electron microscope
dc.contributor.authorKhursheed, A.
dc.contributor.authorKaruppiah, N.
dc.contributor.authorOsterberg, M.
dc.contributor.authorThong, J.T.L.
dc.date.accessioned2014-06-17T02:37:24Z
dc.date.available2014-06-17T02:37:24Z
dc.date.issued2003-01
dc.identifier.citationKhursheed, A., Karuppiah, N., Osterberg, M., Thong, J.T.L. (2003-01). Add-on transmission attachments for the scanning electron microscope. Review of Scientific Instruments 74 (1 I) : 134-140. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1529301
dc.identifier.issn00346748
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54952
dc.description.abstractThe experimental and theoretical results for add-on transmission attachments developed for the scanning electron microscope (SEM) were discussed. The image resolution of a field emission SEM improved by an order of magnitude due to transmission lens attachment providing an image magnification of several million. A compact energy electron loss spectrometer attachment was also developed.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1529301
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1529301
dc.description.sourcetitleReview of Scientific Instruments
dc.description.volume74
dc.description.issue1 I
dc.description.page134-140
dc.description.codenRSINA
dc.identifier.isiut000180451300020
Appears in Collections:Staff Publications

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