Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/54724
DC FieldValue
dc.titleA portable scanning electron microscope column design based on the use of permanent magnets
dc.contributor.authorKhursheed, A.
dc.contributor.authorPhang, J.C.
dc.contributor.authorThong, J.T.L.
dc.date.accessioned2014-06-16T09:34:09Z
dc.date.available2014-06-16T09:34:09Z
dc.date.issued1998-03
dc.identifier.citationKhursheed, A.,Phang, J.C.,Thong, J.T.L. (1998-03). A portable scanning electron microscope column design based on the use of permanent magnets. Scanning 20 (2) : 87-91. ScholarBank@NUS Repository.
dc.identifier.issn01610457
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54724
dc.description.abstractA portable scanning electron microscope (SEM) column design is presented which makes use of permanent magnets. Simulation results predict that such an SEM column is feasible and that it can be compact. The column height is typically less than 12 cm. The column is designed to be modular, so that it can fit onto a wide range of different specimen chamber types, and can also be readily replaced.
dc.sourceScopus
dc.subjectColumns
dc.subjectMiniature
dc.subjectPermanent magnets
dc.subjectScanning electron microscope
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleScanning
dc.description.volume20
dc.description.issue2
dc.description.page87-91
dc.description.codenSCNND
dc.identifier.isiutNOT_IN_WOS
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