Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/54724
DC Field | Value | |
---|---|---|
dc.title | A portable scanning electron microscope column design based on the use of permanent magnets | |
dc.contributor.author | Khursheed, A. | |
dc.contributor.author | Phang, J.C. | |
dc.contributor.author | Thong, J.T.L. | |
dc.date.accessioned | 2014-06-16T09:34:09Z | |
dc.date.available | 2014-06-16T09:34:09Z | |
dc.date.issued | 1998-03 | |
dc.identifier.citation | Khursheed, A.,Phang, J.C.,Thong, J.T.L. (1998-03). A portable scanning electron microscope column design based on the use of permanent magnets. Scanning 20 (2) : 87-91. ScholarBank@NUS Repository. | |
dc.identifier.issn | 01610457 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/54724 | |
dc.description.abstract | A portable scanning electron microscope (SEM) column design is presented which makes use of permanent magnets. Simulation results predict that such an SEM column is feasible and that it can be compact. The column height is typically less than 12 cm. The column is designed to be modular, so that it can fit onto a wide range of different specimen chamber types, and can also be readily replaced. | |
dc.source | Scopus | |
dc.subject | Columns | |
dc.subject | Miniature | |
dc.subject | Permanent magnets | |
dc.subject | Scanning electron microscope | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.description.sourcetitle | Scanning | |
dc.description.volume | 20 | |
dc.description.issue | 2 | |
dc.description.page | 87-91 | |
dc.description.coden | SCNND | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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