1. ScholarBank@NUS
  2. 1. Staff
  3. Staff Publications
Please use this identifier to cite or link to this item: https://doi.org/10.1016/0026-2714(95)00122-I
DC FieldValue
dc.titleA mixed Poisson model and its application to attribute testing data
dc.contributor.authorXie, W.
dc.contributor.authorXie, M.
dc.contributor.authorGoh, T.N.
dc.date.accessioned2014-06-16T09:30:37Z
dc.date.available2014-06-16T09:30:37Z
dc.date.issued1996-02
dc.identifier.citationXie, W., Xie, M., Goh, T.N. (1996-02). A mixed Poisson model and its application to attribute testing data. Microelectronics Reliability 36 (2) : 133-140. ScholarBank@NUS Repository. https://doi.org/10.1016/0026-2714(95)00122-I
dc.identifier.issn00262714
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54388
dc.description.abstractA two-component mixed Poisson distribution useful in modeling and analyzing of certain quality and reliability data is studied in this paper. Its statistical properties, physical interpretations, and some practical issues are discussed. The model generalizes a previously proposed model which describes a perfect process subject to random shocks. The approach of using the model and its application are highlighted using some actual data.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/0026-2714(95)00122-I
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1016/0026-2714(95)00122-I
dc.description.sourcetitleMicroelectronics Reliability
dc.description.volume36
dc.description.issue2
dc.description.page133-140
dc.description.codenMCRLA
dc.identifier.isiutA1996TH13800002
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.