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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1862337
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dc.titleTensile test of a single nanofiber using an atomic force microscope tip
dc.contributor.authorTan, E.P.S.
dc.contributor.authorGoh, C.N.
dc.contributor.authorSow, C.H.
dc.contributor.authorLim, C.T.
dc.date.accessioned2014-04-24T09:37:24Z
dc.date.available2014-04-24T09:37:24Z
dc.date.issued2005-02-14
dc.identifier.citationTan, E.P.S., Goh, C.N., Sow, C.H., Lim, C.T. (2005-02-14). Tensile test of a single nanofiber using an atomic force microscope tip. Applied Physics Letters 86 (7) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1862337
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/51533
dc.description.abstractIn this study, an approach using an atomic force microscope (AFM) tip to stretch a single electrospun polyethylene oxide (PEO) nanofiber is demonstrated. One end of the nanofiber is attached to a movable optical microscope stage and the other end of the nanofiber to a piezoresistive AFM cantilever tip. The nanofiber is stretched by moving the microscope stage and the force is measured via the deflection of the cantilever. The elastic modulus of PEO nanofiber is found to be about 45 MPa. © 2005 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1862337
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.departmentBIOENGINEERING
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1862337
dc.description.sourcetitleApplied Physics Letters
dc.description.volume86
dc.description.issue7
dc.description.page1-3
dc.description.codenAPPLA
dc.identifier.isiut000227439400089
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