Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.456811
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dc.titleSelective photon-breaking of C-S bonds in polythiophene to form quasi-one-dimensional carbon chains in cubic nanocrystals
dc.contributor.authorRen, Z.M.
dc.contributor.authorLu, Y.F.
dc.contributor.authorChoy, H.W.
dc.contributor.authorChong, T.C.
dc.contributor.authorNg, S.C.
dc.contributor.authorMiao, P.
dc.date.accessioned2014-04-24T08:37:31Z
dc.date.available2014-04-24T08:37:31Z
dc.date.issued2002
dc.identifier.citationRen, Z.M., Lu, Y.F., Choy, H.W., Chong, T.C., Ng, S.C., Miao, P. (2002). Selective photon-breaking of C-S bonds in polythiophene to form quasi-one-dimensional carbon chains in cubic nanocrystals. Proceedings of SPIE - The International Society for Optical Engineering 4426 : 35-38. ScholarBank@NUS Repository. https://doi.org/10.1117/12.456811
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/51245
dc.description.abstractA solid polythiophene pellet was ablated by a KrF excimer laser beam to deposit thin films on silicon substrates. The laser-ablated plasma was studied by optical emission spectroscopy to identify the photon-breaking of C-S bonds in the ablated heterocycles. The selective photon-induced bond breaking was also supported by Raman and X-ray photoelectron spectroscopy measurements of the deposited thin films. The thin films appeared to be composed of cubic nanocrystals with an uniform size of 240 nm. X-ray diffraction measurement determined the cubic crystal structures with a lattice constant of a = 3.38 Å and suggested a quasi-one-dimensional carbon chain structure along the body diagonal of the cube.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.456811
dc.sourceScopus
dc.subjectCarbon
dc.subjectCarbon chain
dc.subjectCubic nanocrystal
dc.subjectOne-dimensional
dc.subjectPhoton bond-breaking
dc.typeConference Paper
dc.contributor.departmentCHEMISTRY
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1117/12.456811
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume4426
dc.description.page35-38
dc.description.codenPSISD
dc.identifier.isiut000176422100005
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