Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/50996
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dc.titleNumerical characterization of bistatic scattering from PEC cylinder partially embedded in a dielectric rough surface interface: Horizontal polarization
dc.contributor.authorWang, X.
dc.contributor.authorLi, L.-W.
dc.date.accessioned2014-04-24T07:23:30Z
dc.date.available2014-04-24T07:23:30Z
dc.date.issued2009
dc.identifier.citationWang, X.,Li, L.-W. (2009). Numerical characterization of bistatic scattering from PEC cylinder partially embedded in a dielectric rough surface interface: Horizontal polarization. Progress in Electromagnetics Research 91 : 35-51. ScholarBank@NUS Repository.
dc.identifier.issn10704698
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/50996
dc.description.abstractScattering from a two-dimensional (2-D) perfectly electrically conducting (PEC) cylinder partially embedded in a random dielectric rough surface interface is studied using the method of moments (MoM) with pulse basis functions and the point matching technique, for the case of horizontal polarization. The random rough surface is modeled using Gaussian statistical characteristic for the rough surface height and surface correlation function, and generated by the spectral-method. The tapered plane-wave incidence is used to avoid artificial edge diffraction due to the truncation of the rough surface into finite-length rough surface in the numerical simulations. With the developed algorithms, the interactions between the dielectric rough surface and the partially buried PEC cylinder are investigated using the Monte Carlo simulation, and are expressed as a function of the root mean square (rms) height of a random dielectric rough surface and the moisture content of the soil. The numerical results show that the bistatic scattering coefficients are dependent upon the moisture content, the rms height of a rough surface, and other parameters.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleProgress in Electromagnetics Research
dc.description.volume91
dc.description.page35-51
dc.identifier.isiutNOT_IN_WOS
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