Please use this identifier to cite or link to this item:
https://doi.org/10.1016/j.ultramic.2008.09.001
DC Field | Value | |
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dc.title | A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collection | |
dc.contributor.author | Khursheed, A. | |
dc.contributor.author | Hoang, H.Q. | |
dc.date.accessioned | 2014-04-24T07:19:21Z | |
dc.date.available | 2014-04-24T07:19:21Z | |
dc.date.issued | 2008-12 | |
dc.identifier.citation | Khursheed, A., Hoang, H.Q. (2008-12). A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collection. Ultramicroscopy 109 (1) : 104-110. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ultramic.2008.09.001 | |
dc.identifier.issn | 03043991 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/50854 | |
dc.description.abstract | This paper presents a toroidal electron energy spectrometer designed to capture electrons in the full 2π azimuthal angular direction while at the same time having second-order focusing optics. Simulation results based upon direct ray tracing predict that the relative energy resolution of the spectrometer will be 0.146% and 0.0188% at input angular spreads of ±6° and ±3°, respectively, comparable to the theoretically best resolution of the cylindrical mirror analyzer (CMA), and an order of magnitude better than existing toroidal spectrometers. Also predicted for the spectrometer is a parallel energy acquisition mode of operation, where the energy bandwidth is expected to be >±10% (20% total) of the pass energy. The spectrometer is designed to allow for retardation of the pass energy without the need to incorporate auxiliary lenses. © 2008 Elsevier B.V. All rights reserved. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.ultramic.2008.09.001 | |
dc.source | Scopus | |
dc.subject | Auger electron spectroscopy | |
dc.subject | Electron energy spectrometers | |
dc.subject | Scanning electron microscope | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1016/j.ultramic.2008.09.001 | |
dc.description.sourcetitle | Ultramicroscopy | |
dc.description.volume | 109 | |
dc.description.issue | 1 | |
dc.description.page | 104-110 | |
dc.description.coden | ULTRD | |
dc.identifier.isiut | 000261750500015 | |
Appears in Collections: | Staff Publications |
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