Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.ultramic.2008.09.001
DC FieldValue
dc.titleA second-order focusing electrostatic toroidal electron spectrometer with 2π radian collection
dc.contributor.authorKhursheed, A.
dc.contributor.authorHoang, H.Q.
dc.date.accessioned2014-04-24T07:19:21Z
dc.date.available2014-04-24T07:19:21Z
dc.date.issued2008-12
dc.identifier.citationKhursheed, A., Hoang, H.Q. (2008-12). A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collection. Ultramicroscopy 109 (1) : 104-110. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ultramic.2008.09.001
dc.identifier.issn03043991
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/50854
dc.description.abstractThis paper presents a toroidal electron energy spectrometer designed to capture electrons in the full 2π azimuthal angular direction while at the same time having second-order focusing optics. Simulation results based upon direct ray tracing predict that the relative energy resolution of the spectrometer will be 0.146% and 0.0188% at input angular spreads of ±6° and ±3°, respectively, comparable to the theoretically best resolution of the cylindrical mirror analyzer (CMA), and an order of magnitude better than existing toroidal spectrometers. Also predicted for the spectrometer is a parallel energy acquisition mode of operation, where the energy bandwidth is expected to be >±10% (20% total) of the pass energy. The spectrometer is designed to allow for retardation of the pass energy without the need to incorporate auxiliary lenses. © 2008 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.ultramic.2008.09.001
dc.sourceScopus
dc.subjectAuger electron spectroscopy
dc.subjectElectron energy spectrometers
dc.subjectScanning electron microscope
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.ultramic.2008.09.001
dc.description.sourcetitleUltramicroscopy
dc.description.volume109
dc.description.issue1
dc.description.page104-110
dc.description.codenULTRD
dc.identifier.isiut000261750500015
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