Please use this identifier to cite or link to this item: https://doi.org/10.1109/SSIRI-C.2010.29
DC FieldValue
dc.titleFormal analysis for stateflow diagrams
dc.contributor.authorChen, C.
dc.date.accessioned2013-07-04T08:45:37Z
dc.date.available2013-07-04T08:45:37Z
dc.date.issued2010
dc.identifier.citationChen, C. (2010). Formal analysis for stateflow diagrams. SSIRI-C 2010 - 4th IEEE International Conference on Secure Software Integration and Reliability Improvement Companion : 102-109. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/SSIRI-C.2010.29" target="_blank">https://doi.org/10.1109/SSIRI-C.2010.29</a>
dc.identifier.isbn9780769540870
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/42190
dc.description.abstractStateflow has been widely used in industry to specify and simulate control systems. Unfortunately, the lack of formal descriptions of Stateflow and its limited verification capability become an obstacle to handle complex systems working in safety-critical environment. In this paper, we apply a novel model checker named PAT to improve the reliability of Stateflow. We rigorously model the execution semantics of Stateflow in PAT's expressive specification language. PAT's simulation ability provides a means to validate our formal definitions of Stateflow. During the formalization procedure, we have discovered and corrected subtle flaws of Stateflow. Based on the PAT models of Stateflow, we can use PAT's automatic reasoning power to verify complex systems against important requirements such as safety and liveness requirements. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/SSIRI-C.2010.29
dc.sourceScopus
dc.subjectFormal methods
dc.subjectModel checking
dc.subjectStateflow
dc.typeConference Paper
dc.contributor.departmentCOMPUTER SCIENCE
dc.description.doi10.1109/SSIRI-C.2010.29
dc.description.sourcetitleSSIRI-C 2010 - 4th IEEE International Conference on Secure Software Integration and Reliability Improvement Companion
dc.description.page102-109
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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