Please use this identifier to cite or link to this item: https://doi.org/10.1109/WCRE.2010.20
DC FieldValue
dc.titleUnderstanding feature evolution in a family of product variants
dc.contributor.authorXue, Y.
dc.contributor.authorXing, Z.
dc.contributor.authorJarzabek, S.
dc.date.accessioned2013-07-04T07:52:32Z
dc.date.available2013-07-04T07:52:32Z
dc.date.issued2010
dc.identifier.citationXue, Y.,Xing, Z.,Jarzabek, S. (2010). Understanding feature evolution in a family of product variants. Proceedings - Working Conference on Reverse Engineering, WCRE : 109-118. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/WCRE.2010.20" target="_blank">https://doi.org/10.1109/WCRE.2010.20</a>
dc.identifier.isbn9780769541235
dc.identifier.issn10951350
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/39916
dc.description.abstractExisting software product variants, developed by ad hoc reuse such as copy-paste-modify, are often a starting point for building Software Product Line (SPL). Understanding of how features evolved in product variants is a prerequisite to transition from ad hoc to systematic SPL reuse. We propose a method that assists analysts in detecting changes to product features during evolution. We first entail that features and their inter-dependencies for each product variant are documented as product feature model. We then apply model differencing algorithm to identify evolutionary changes that occurred to features of different product variants. We evaluate the effectiveness of our approach on a family of medium-size financial systems. We also investigate the scalability of our approach with synthetic data. The evaluation demonstrates that our approach yields good results and scales to large systems. Our approach enables the subsequent variability analysis and consolidation of product variants in the task of reengineering product variants into SPL. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/WCRE.2010.20
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentCOMPUTER SCIENCE
dc.description.doi10.1109/WCRE.2010.20
dc.description.sourcetitleProceedings - Working Conference on Reverse Engineering, WCRE
dc.description.page109-118
dc.identifier.isiutNOT_IN_WOS
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