APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/35454

DC Field	Value
dc.title	APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
dc.contributor	NATIONAL UNIVERSITY OF SINGAPORE
dc.contributor.author	SHEN, ZE XIANG
dc.contributor.author	SUN, WANXIN
dc.date.accessioned	2012-11-21T08:57:57Z
dc.date.available	2012-11-21T08:57:57Z
dc.date.issued	2002-09-06
dc.identifier.citation	SHEN, ZE XIANG,SUN, WANXIN (2002-09-06). APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY. ScholarBank@NUS Repository.
dc.identifier.uri	http://scholarbank.nus.edu.sg/handle/10635/35454
dc.description.abstract	A laser beam (24) is focused to a small spot size onto a sample (14). A silver coated metal probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The metal probe (16) enhances the Raman signal, and provides high resolution. It may be cantilevered, and scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).
dc.description.uri	http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/http://analytics.patsnap.com/patent_view/view?pn=WO2002068919A1
dc.source	PatSnap
dc.type	Patent
dc.contributor.department	PHYSICS
dc.identifier.isiut	NOT_IN_WOS
dc.description.patentno	WO2002068919A1
dc.description.patenttype	Published Application
Appears in Collections:	Staff Publications

File	Description	Size	Format	Access Settings	Version
WO2002068919A1.PDF		553.51 kB	Adobe PDF	OPEN	Published	View/Download

Check