Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/34812
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dc.titleCathodoluminescence detector
dc.contributorNATIONAL UNIVERSITY OF SINGAPORE
dc.contributor.authorPHANG, JACOB CHEE HONG
dc.contributor.authorCHAN, DANIEL SIU HUNG
dc.contributor.authorPEY, KIN LEONG
dc.date.accessioned2012-10-05T06:00:40Z
dc.date.available2012-10-05T06:00:40Z
dc.date.issued1994-05-25
dc.identifier.citationPHANG, JACOB CHEE HONG,CHAN, DANIEL SIU HUNG,PEY, KIN LEONG (1994-05-25). Cathodoluminescence detector. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/34812
dc.description.abstractA cathodoluminescence detector (11) for the vacuum chamber specimen stage of an electron microscope comprises a base member adaptor element (27) with threaded stub (30) to connect with the microscope specimen stage (not shown here), and supporting specimen (14) on support (15) mounted on threaded boss part (27a) of element (27). Boss (27a) is secured with a planar support (21) which carries an annular photosensitive member (19) with interposed insulant layer (22) and connections (24). A parabolic reflector (16) is located over member (19) and includes aperture (18) for passage of electron beam (13). The polished concave reflective surface (17) of reflector (16) reflects radiation emitted from specimen (14) to member (19) and absorbs backscattered electrons from the specimen (14).
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/http://analytics.patsnap.com/patent_view/view?pn=EP0598569A1
dc.sourcePatSnap
dc.typePatent
dc.contributor.departmentELECTRICAL ENGINEERING
dc.identifier.isiutNOT_IN_WOS
dc.description.patentnoEP0598569A1
dc.description.patenttypePublished Application
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