Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/32704
DC FieldValue
dc.titleLens for a scanning electron microscope
dc.contributor.authorKHURSHEED, ANJAM
dc.date.accessioned2012-05-02T02:29:08Z
dc.date.available2012-05-02T02:29:08Z
dc.date.issued2005-06-14
dc.identifier.citationKHURSHEED, ANJAM (2005-06-14). Lens for a scanning electron microscope. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/32704
dc.description.abstractA lens (15) for a scanning electron microscope is adapted to be removably mounted on a specimen stage (1). The lens (15) includes a magnetic circuit (2, 3, 4, 7) having a first magnetic pole piece (7) and a second magnetic pole piece (4), and a specimen holder (5). The specimen holder (5) is located between the first and second magnetic pole pieces (4, 7). The magnetic circuit (2, 3, 4, 7) also includes a lens bore (18) to permit an electron beam (9) to strike a surface of a specimen mounted on the specimen holder (5), in use. The lens bore (18) has a width of greater than 1 mm.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/http://analytics.patsnap.com/patent_view/view?pn=US6906335
dc.sourcePatSnap
dc.typePatent
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.identifier.isiutNOT_IN_WOS
dc.description.patentnoUS6906335
dc.description.patenttypeGranted Patent
dc.contributor.patentassigneeNATIONAL UNIVERSITY OF SINGAPORE
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
US6906335.PDF72.52 kBAdobe PDF

OPEN

PublishedView/Download

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.