Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/32575
DC Field | Value | |
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dc.title | Method and apparatus to image metallic patches embedded in a non-metal surface | |
dc.contributor.author | CHA, CHER LIANG RANDALL | |
dc.contributor.author | GONG, HAO | |
dc.contributor.author | CHOR, ENG FONG | |
dc.contributor.author | CHAN, LAP | |
dc.date.accessioned | 2012-05-02T02:27:15Z | |
dc.date.available | 2012-05-02T02:27:15Z | |
dc.date.issued | 2000-05-16 | |
dc.identifier.citation | CHA, CHER LIANG RANDALL,GONG, HAO,CHOR, ENG FONG,CHAN, LAP (2000-05-16). Method and apparatus to image metallic patches embedded in a non-metal surface. ScholarBank@NUS Repository. | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/32575 | |
dc.description.abstract | Small metallic patches embedded in a mainly non-metallic surface may be detected and mapped by placing a wire coil at the free end of a cantilever, with a fine tip made of a ferro-magnetic material located at its center. An alternating current is passed through the coil so that when it is near a metallic patch eddy currents are induced in the patch. These produce a small magnetic moment in the patch which pulls the tip towards the surface. This movement of the tip is detected by observing a light beam that is reflected off the surface of the cantilever. By plotting the output of a photodetector, sensistive to small changes in the reflected beam's position, as a function of the tip's location over the surface, a map of the metallic patches is produced. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/http://analytics.patsnap.com/patent_view/view?pn=US6064201 | |
dc.source | PatSnap | |
dc.type | Patent | |
dc.contributor.department | MATERIALS SCIENCE | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.identifier.isiut | NOT_IN_WOS | |
dc.description.patentno | US6064201 | |
dc.description.patenttype | Granted Patent | |
dc.contributor.patentassignee | CHARTERED SEMICONDUCTOR MANUFACTURING LTD. (SINGAPORE, SG) | |
dc.contributor.patentassignee | NATIONAL UNIVERSITY OF SINGAPORE | |
Appears in Collections: | Staff Publications |
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US6064201.PDF | 53.37 kB | Adobe PDF | OPEN | Published | View/Download |
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