Please use this identifier to cite or link to this item: https://doi.org/10.1088/2053-1591/abd3e4
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dc.titleRobust domain variants and ferroelectric property in epitaxial BiFeO3 films
dc.contributor.authorQiao, Xiaojun
dc.contributor.authorGeng, Wenping
dc.contributor.authorMeng, Jianwei
dc.contributor.authorSun, Yao
dc.contributor.authorBi, Kaixi
dc.contributor.authorYang, Yun
dc.contributor.authorYu, Junbin
dc.contributor.authorHe, Jian
dc.contributor.authorChou, Xiujian
dc.date.accessioned2022-10-13T01:16:29Z
dc.date.available2022-10-13T01:16:29Z
dc.date.issued2021-01-01
dc.identifier.citationQiao, Xiaojun, Geng, Wenping, Meng, Jianwei, Sun, Yao, Bi, Kaixi, Yang, Yun, Yu, Junbin, He, Jian, Chou, Xiujian (2021-01-01). Robust domain variants and ferroelectric property in epitaxial BiFeO3 films. Materials Research Express 8 (1) : abd3e4. ScholarBank@NUS Repository. https://doi.org/10.1088/2053-1591/abd3e4
dc.identifier.issn2053-1591
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/232877
dc.description.abstractLead-free ferroelectric thin films have great potential for electric devices owing to the dramatically expanding information epoch. Exploring the domain engineering and temperature stability of ferroelectric films are still urgent since these polarization dipoles are sensitive to external effects. In this work, the temperature dependence of domain dynamic and local piezoelectric response were investigated in epitaxial BiFeO3 (BFO) thin films prepared by pulse leaser deposition (PLD) technology, which exhibiting well-defined polarization switchable intrinsic property. Regarding to temperature endurance, domain variants remain quite stable state regarding to both the vertical and lateral direction, which is in consistent with the free-energy minimum competition theory. Besides, the piezoelectric response along vertical and lateral direction exhibit good temperature endurance. This work demonstrates thin films with rather stable ferroelectric states, which show not only exploration on domain dynamic corresponding to temperature influence, but also promising potential application in electrical storage devices especially working under high temperature. © 2020 The Author(s).
dc.publisherIOP Publishing Ltd
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.sourceScopus OA2021
dc.subjectAtomic force microscopy
dc.subjectBiFeO3
dc.subjectFerroelectrics
dc.subjectPiezoresponse force microscope (PFM)
dc.subjectSwitching spectroscopy piezoresponse force microscope (SS-PFM)
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1088/2053-1591/abd3e4
dc.description.sourcetitleMaterials Research Express
dc.description.volume8
dc.description.issue1
dc.description.pageabd3e4
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