Please use this identifier to cite or link to this item: https://doi.org/10.1364/oe.445978
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dc.titleNumerical and experimental study of partial coherence for near-field and far-field ptychography
dc.contributor.authorXu, Wenhui
dc.contributor.authorNing, Shoucong
dc.contributor.authorZhang, Fucai
dc.date.accessioned2022-10-11T07:51:08Z
dc.date.available2022-10-11T07:51:08Z
dc.date.issued2021-11-11
dc.identifier.citationXu, Wenhui, Ning, Shoucong, Zhang, Fucai (2021-11-11). Numerical and experimental study of partial coherence for near-field and far-field ptychography. Optics Express 29 (24) : 40652-40667. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.445978
dc.identifier.issn1094-4087
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/231985
dc.description.abstractHigh degree of coherence is essential in coherent diffraction imaging (CDI). The coherence requirement on the light source varies with the experimental configuration. As a scanning variant of CDI, ptychography has shown great potential for extensive applications. To determine the influence of partially temporal and spatial coherence on near- and far-field ptychography, we have performed a series of numerical simulations and visible light optical experiments. We demonstrated that the near-field is more robust to spatial and temporal decoherence than the far-field. In addition, the far-field is found to be more sensitive to spatial decoherence than to temporal decoherence. Our experiments also show that a known probe estimate with good spatial coherence enables the retrieval qualities to be enhanced dramatically and helps prevent falling into the local minimums in the reconstruction process. Our work would provide a valuable reference for implementing ptychography with sources of limited coherence. © 2021 Optica Publishing Group
dc.publisherThe Optical Society
dc.rightsAttribution 4.0 International
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.sourceScopus OA2021
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1364/oe.445978
dc.description.sourcetitleOptics Express
dc.description.volume29
dc.description.issue24
dc.description.page40652-40667
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