Please use this identifier to cite or link to this item:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830158
DC Field | Value | |
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dc.title | Fully-Digital Broadband Calibration-Less Impedance Monitor for Probe Insertion Detection against Power Analysis Attacks | |
dc.contributor.author | Himadri Singh Raghav | |
dc.contributor.author | Viveka Konandur Rajanna | |
dc.contributor.author | Tianqi Wang | |
dc.contributor.author | Massimo Alioto | |
dc.date.accessioned | 2022-09-13T06:51:29Z | |
dc.date.available | 2022-09-13T06:51:29Z | |
dc.date.issued | 2022-07-22 | |
dc.identifier.citation | Himadri Singh Raghav, Viveka Konandur Rajanna, Tianqi Wang, Massimo Alioto (2022-07-22). Fully-Digital Broadband Calibration-Less Impedance Monitor for Probe Insertion Detection against Power Analysis Attacks. 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) : 144-145. ScholarBank@NUS Repository. https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830158 | |
dc.identifier.isbn | 978-1-6654-9772-5 | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/231088 | |
dc.description.abstract | In this work, a broadband supply impedance monitor is proposed to detect insertion of probing devices or package/PCB modifications in secure systems. The fully-digital architecture allows automated and portable design, and its compact area allows under-pad placement for inexpensive adoption. Ratiometric measurements suppress variations at no calibration, temporal zooming enhances sensitivity to reactance. Detection of several attacks with different probing devices is demonstrated with a 28-nm testchip up to 2 GHz. | |
dc.description.uri | https://scholarbank.nus.edu.sg/handle/10635/21885812 | |
dc.language.iso | en | |
dc.publisher | IEEE | |
dc.relation.ispartofseries | 10635;21885812 | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL AND COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/VLSITechnologyandCir46769.2022.9830158 | |
dc.description.sourcetitle | 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) | |
dc.description.page | 144-145 | |
dc.published.state | Published | |
dc.grant.id | NRF2018NCR-NCR002-0001 | |
dc.grant.fundingagency | Singapore National Research Foundation (NRF) | |
Appears in Collections: | Staff Publications Elements |
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