Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/208660
Title: ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM
Authors: FANG HANYAN
ORCID iD:   orcid.org/0000-0002-1529-2195
Keywords: 2D semiconductor, scanning tunneling microscopy, non-contact atomic microscopy, single vacancy, vacancy cluster, domain boundary
Issue Date: 29-Apr-2021
Citation: FANG HANYAN (2021-04-29). ATOMIC DEFECTS CHARACTERIZATION AND ENGINEERING IN 2D SEMICONDUCTORS BY STM/NC-AFM. ScholarBank@NUS Repository.
URI: https://scholarbank.nus.edu.sg/handle/10635/208660
Appears in Collections:Ph.D Theses (Closed)

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