Please use this identifier to cite or link to this item:
https://doi.org/10.1109/MEI.2021.9399911
DC Field | Value | |
---|---|---|
dc.title | Switchgear Condition Assessment and Lifecycle Management: standards, failure statistics, condition assessment, PD analysis, maintenance approach and future trends | |
dc.contributor.author | ARAVINTH SUBRAMANIAM | |
dc.contributor.author | ANIMESH KUMAR SAHOO | |
dc.contributor.author | SAI SRINIVAS MANOHAR | |
dc.contributor.author | SANTOSH JANAKI RAMAN | |
dc.contributor.author | Panda, S.K. | |
dc.date.accessioned | 2021-10-06T10:29:12Z | |
dc.date.available | 2021-10-06T10:29:12Z | |
dc.date.issued | 2021-04-09 | |
dc.identifier.citation | ARAVINTH SUBRAMANIAM, ANIMESH KUMAR SAHOO, SAI SRINIVAS MANOHAR, SANTOSH JANAKI RAMAN, Panda, S.K. (2021-04-09). Switchgear Condition Assessment and Lifecycle Management: standards, failure statistics, condition assessment, PD analysis, maintenance approach and future trends. IEEE Electrical Insulation Magazine 37 (3) : 27-41. ScholarBank@NUS Repository. https://doi.org/10.1109/MEI.2021.9399911 | |
dc.identifier.issn | 0883-7554 | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/202109 | |
dc.language.iso | en | |
dc.publisher | IEEE | |
dc.subject | maintenance management | |
dc.subject | switchgear standards | |
dc.subject | condition assessment | |
dc.subject | switchgear failure statistics | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL AND COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/MEI.2021.9399911 | |
dc.description.sourcetitle | IEEE Electrical Insulation Magazine | |
dc.description.volume | 37 | |
dc.description.issue | 3 | |
dc.description.page | 27-41 | |
dc.published.state | Published | |
dc.grant.fundingagency | 10.13039/501100001381-National Research Foundation, Singapore | |
Appears in Collections: | Staff Publications Elements |
Show simple item record
Files in This Item:
File | Description | Size | Format | Access Settings | Version | |
---|---|---|---|---|---|---|
Subramaniam_et_al_review 2_V3 AS (1).docx | 1.32 MB | Microsoft Word XML | OPEN | Post-print | View/Download |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.