Please use this identifier to cite or link to this item: https://doi.org/10.1002/advs.202003993
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dc.titleNanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy
dc.contributor.authorZeng, Qibin
dc.contributor.authorWang, Hongli
dc.contributor.authorXiong, Zhuang
dc.contributor.authorHuang, Qicheng
dc.contributor.authorLu, Wanheng
dc.contributor.authorSun, Kuan
dc.contributor.authorFan, Zhen
dc.contributor.authorZeng, Kaiyang
dc.date.accessioned2021-02-24T07:28:51Z
dc.date.available2021-02-24T07:28:51Z
dc.date.issued2021-02-15
dc.identifier.citationZeng, Qibin, Wang, Hongli, Xiong, Zhuang, Huang, Qicheng, Lu, Wanheng, Sun, Kuan, Fan, Zhen, Zeng, Kaiyang (2021-02-15). Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy. Advanced Science : 2003993-2003993. ScholarBank@NUS Repository. https://doi.org/10.1002/advs.202003993
dc.identifier.issn21983844
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/186660
dc.description.abstractPiezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations which are largely challenging its validity and applications. In this study, an advanced PFM technique is reported, namely heterodyne megasonic piezoresponse force microscopy (HM‐PFM), which uses 106 to 108 Hz high‐frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. It is found that HM‐PFM can unambiguously provide standard ferroelectric domain and hysteresis loop measurements, and an effective domain characterization with excitation frequency up to ≈110 MHz is demonstrated. Most importantly, owing to the high‐frequency and heterodyne scheme, the contributions from both electrostatic force and electrochemical strain can be significantly minimized in HM‐PFM. Furthermore, a special measurement of difference‐frequency piezoresponse frequency spectrum (DFPFS) is developed on HM‐PFM and a distinct DFPFS characteristic is observed on the materials with piezoelectricity. By performing DFPFS measurement, a truly existed but very weak electromechanical coupling in CH3NH3PbI3 perovskite is revealed. It is believed that HM‐PFM can be an excellent candidate for the ferroelectric or piezoelectric studies where conventional PFM results are highly controversial.
dc.publisherWiley
dc.sourceElements
dc.typeArticle
dc.date.updated2021-02-24T06:28:34Z
dc.contributor.departmentDEPT OF MATERIALS SCIENCE & ENGINEERING
dc.contributor.departmentDEPT OF MECHANICAL ENGINEERING
dc.description.doi10.1002/advs.202003993
dc.description.sourcetitleAdvanced Science
dc.description.page2003993-2003993
dc.published.statePublished
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