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https://scholarbank.nus.edu.sg/handle/10635/182150
| Title: | MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS | Authors: | SEAH BOON PIAN | Issue Date: | 1996 | Citation: | SEAH BOON PIAN (1996). MODELLING AND SIMULATING OF HOT-CARRIER DEGRADATION IN SUBMICROMETRE MOS TRANSISTORS. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/182150 |
| Appears in Collections: | Master's Theses (Restricted) |
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| b2012868x.pdf | 8.16 MB | Adobe PDF | RESTRICTED | None | Log In |
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