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https://doi.org/10.1088/1367-2630/aa60ee
DC Field | Value | |
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dc.title | Subdiffraction incoherent optical imaging via spatial-mode demultiplexing | |
dc.contributor.author | Tsang, M | |
dc.date.accessioned | 2020-10-23T02:34:41Z | |
dc.date.available | 2020-10-23T02:34:41Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | Tsang, M (2017). Subdiffraction incoherent optical imaging via spatial-mode demultiplexing. New Journal of Physics 19 (2) : 23054. ScholarBank@NUS Repository. https://doi.org/10.1088/1367-2630/aa60ee | |
dc.identifier.issn | 13672630 | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/179239 | |
dc.description.abstract | I propose a spatial-mode demultiplexing (SPADE) measurement scheme for the far-field imaging of spatially incoherent optical sources. For any object too small to be resolved by direct imaging under the diffraction limit, I show that SPADE can estimate its second or higher moments much more precisely than direct imaging can fundamentally do in the presence of photon shot noise. I also prove that SPADE can approach the optimal precision allowed by quantum mechanics in estimating the location and scale parameters of a subdiffraction object. Realizable with far-field linear optics and photon counting, SPADE is expected to find applications in both fluorescence microscopy and astronomy. © 2017 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. | |
dc.publisher | Institute of Physics Publishing | |
dc.rights | Attribution 4.0 International | |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | |
dc.source | Unpaywall 20201031 | |
dc.subject | Demultiplexing | |
dc.subject | Diffraction | |
dc.subject | Fluorescence | |
dc.subject | Fluorescence microscopy | |
dc.subject | Photons | |
dc.subject | Quantum optics | |
dc.subject | Shot noise | |
dc.subject | Telescopes | |
dc.subject | Diffraction limits | |
dc.subject | Far-field imaging | |
dc.subject | Incoherent imaging | |
dc.subject | Location and scale parameters | |
dc.subject | Optical imaging | |
dc.subject | Optimal precision | |
dc.subject | Quantum metrology | |
dc.subject | Super resolution | |
dc.subject | Parameter estimation | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL AND COMPUTER ENGINEERING | |
dc.description.doi | 10.1088/1367-2630/aa60ee | |
dc.description.sourcetitle | New Journal of Physics | |
dc.description.volume | 19 | |
dc.description.issue | 2 | |
dc.description.page | 23054 | |
dc.published.state | Published | |
Appears in Collections: | Elements Staff Publications |
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