Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/179132
| Title: | CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON | Authors: | CHENG ZHIYUAN | Issue Date: | 1999 | Citation: | CHENG ZHIYUAN (1999). CARRIER LIFETIME CHARACTERIZATION TECHNIQUES IN SOI AND BULK SILICON. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/179132 |
| Appears in Collections: | Ph.D Theses (Restricted) |
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| b22083157.pdf | 8.82 MB | Adobe PDF | RESTRICTED | None | Log In |
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