Please use this identifier to cite or link to this item: https://doi.org/10.1038/s41598-017-04882-4
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dc.titleA low-frequency chip-scale optomechanical oscillator with 58 kHz mechanical stiffening and more than 100th-order stable harmonics
dc.contributor.authorHuang, Y
dc.contributor.authorFlores, J.G.F
dc.contributor.authorCai, Z
dc.contributor.authorYu, M
dc.contributor.authorKwong, D.-L
dc.contributor.authorWen, G
dc.contributor.authorChurchill, L
dc.contributor.authorWong, C.W
dc.date.accessioned2020-10-20T10:30:59Z
dc.date.available2020-10-20T10:30:59Z
dc.date.issued2017
dc.identifier.citationHuang, Y, Flores, J.G.F, Cai, Z, Yu, M, Kwong, D.-L, Wen, G, Churchill, L, Wong, C.W (2017). A low-frequency chip-scale optomechanical oscillator with 58 kHz mechanical stiffening and more than 100th-order stable harmonics. Scientific Reports 7 (1) : 4882. ScholarBank@NUS Repository. https://doi.org/10.1038/s41598-017-04882-4
dc.identifier.issn2045-2322
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/178605
dc.description.abstractFor the sensitive high-resolution force- and field-sensing applications, the large-mass microelectromechanical system (MEMS) and optomechanical cavity have been proposed to realize the sub-aN/Hz1/2 resolution levels. In view of the optomechanical cavity-based force- and field-sensors, the optomechanical coupling is the key parameter for achieving high sensitivity and resolution. Here we demonstrate a chip-scale optomechanical cavity with large mass which operates at ?77.7 kHz fundamental mode and intrinsically exhibiting large optomechanical coupling of 44 GHz/nm or more, for both optical resonance modes. The mechanical stiffening range of ?58 kHz and a more than 100th-order harmonics are obtained, with which the free-running frequency instability is lower than 10-6 at 100 ms integration time. Such results can be applied to further improve the sensing performance of the optomechanical inspired chip-scale sensors. © 2017 The Author(s).
dc.publisherNature Publishing Group
dc.rightsAttribution 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceUnpaywall 20201031
dc.typeArticle
dc.contributor.departmentELECTRICAL AND COMPUTER ENGINEERING
dc.description.doi10.1038/s41598-017-04882-4
dc.description.sourcetitleScientific Reports
dc.description.volume7
dc.description.issue1
dc.description.page4882
dc.published.statepublished
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