Please use this identifier to cite or link to this item: https://doi.org/10.1038/s41598-017-06454-y
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dc.titleRadiation loss of planar surface plasmon polaritons transmission lines at microwave frequencies
dc.contributor.authorXu, Z
dc.contributor.authorLi, S
dc.contributor.authorYin, X
dc.contributor.authorZhao, H
dc.contributor.authorLiu, L
dc.date.accessioned2020-10-20T10:29:36Z
dc.date.available2020-10-20T10:29:36Z
dc.date.issued2017
dc.identifier.citationXu, Z, Li, S, Yin, X, Zhao, H, Liu, L (2017). Radiation loss of planar surface plasmon polaritons transmission lines at microwave frequencies. Scientific Reports 7 (1) : 6098. ScholarBank@NUS Repository. https://doi.org/10.1038/s41598-017-06454-y
dc.identifier.issn2045-2322
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/178599
dc.description.abstractRadiation loss of a typical spoof surface plasmon polaritons (SSPPs) transmission line (TL) is investigated in this paper. A 325 mm-long SSPPs TL is designed and fabricated. Simulated results show that radiation loss contributes more to transmission loss than dielectric loss and conductor loss from 2 GHz to 10 GHz. Radiation loss of the SSPPs TL could be divided into two parts, one is caused by the input mode converter, and the other is caused by the corrugated metallic strip. This paper explains mechanisms of radiation loss from different parts, designs a loaded SSPPs TL with a series of resistors to absorb electromagnetic energy on corrugated metallic strip, and then discriminates radiation loss from the input mode converter, proposes the concept of average radiation length (ARL) to evaluate radiation loss from SSPPs of finite length, and concludes that radiation loss is mainly caused by corrugated structure of finite length at low frequency band and by the input mode converter at high frequency band. To suppress radiation loss, a mixed slow wave TL based on the combination of coplanar waveguides (CPWs) and SSPPs is presented. The designed structure, sample fabrication and experimental verification are discussed. © 2017 The Author(s).
dc.publisherNature Publishing Group
dc.rightsAttribution 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceUnpaywall 20201031
dc.typeArticle
dc.contributor.departmentELECTRICAL AND COMPUTER ENGINEERING
dc.description.doi10.1038/s41598-017-06454-y
dc.description.sourcetitleScientific Reports
dc.description.volume7
dc.description.issue1
dc.description.page6098
dc.published.stateUnpublished
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