Elucidating the functional form of the recombination losses in a planar perovskite solar cell: A scaling analysis

Abstract

Through the analysis of scales on the drift-diffusion device model of a planar-structured perovskite solar cell, we have obtained accurate – analytical expressions that capture the recombination losses within the cell. The recombination losses are resolved into the radiative and Shockley-Read-Hall mechanisms, as well as interfacial recombination between the perovskite and electron/hole-transporting layers. After parameter calibration with the state of the art planar perovskite solar cell of 23.5% efficiency, the percentage contribution of various recombination loss channels within a planar-structured perovskite solar cell is analytically determined through derived scales and numerically verified at the condition of open-circuit voltage and short-circuit current, as well as gives a good prediction of dominant recombination mechanism within the cell. On this basis, a comparison of loss analysis between the estimated scales and numeric results is carried out at the condition of open-circuit voltage when a wide range of parameters influencing the recombination current is deviated simultaneously, and a good agreement is obtained.