Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/177267
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dc.titlePULSED-LASER INDUCED RIPPLE PATTERNS IN SILICON SUBSTRATES
dc.contributor.authorSHI XIAO PING
dc.date.accessioned2020-10-08T07:13:44Z
dc.date.available2020-10-08T07:13:44Z
dc.date.issued1999
dc.identifier.citationSHI XIAO PING (1999). PULSED-LASER INDUCED RIPPLE PATTERNS IN SILICON SUBSTRATES. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/177267
dc.description.abstractIn this thesis, the laser-induced periodic surface structure (LIPSS) for SiO2 / Si was studied using optical and morphology characterization techniques. The factor, such as laser fluence, laser pulse number, laser beam size, laser incident angle, SiO2 layer thickness, sputtered SiO2 after RTA with different RTA time and temperature, different doping type substrates, different initial substrate temperature, which will effect the ripple formation was studied. And also calculations have been made using SLIM program to study excimer laser induced melting and ripple formation on bare Si and SiO2/Si interface. There are also some literature review parts included, which are belief introductions on experimental results and models for ripple formation. At the end, it is the outline of this thesis and some directions for future research.
dc.sourceCCK BATCHLOAD 20201023
dc.subjectLaser-induced periodic surface structure (LIPSS)
dc.subjectTexturing
dc.subjectMicrostmcture
dc.subjectSurface analysis
dc.typeThesis
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.supervisorLU YONG FENG
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF SCIENCE (ELECTRICAL ENGINEERING)
Appears in Collections:Master's Theses (Restricted)

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