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https://scholarbank.nus.edu.sg/handle/10635/174675
| Title: | HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES | Authors: | GOH YONG HAN | Issue Date: | 1998 | Citation: | GOH YONG HAN (1998). HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/174675 |
| Appears in Collections: | Master's Theses (Restricted) |
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| b20615772.pdf | 9.4 MB | Adobe PDF | RESTRICTED | None | Log In |
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