Please use this identifier to cite or link to this item: https://doi.org/10.1038/ncomms15485
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dc.titleAll pure bipartite entangled states can be self-tested
dc.contributor.authorColadangelo, A
dc.contributor.authorGoh, K.T
dc.contributor.authorScarani, V
dc.date.accessioned2020-09-04T03:40:36Z
dc.date.available2020-09-04T03:40:36Z
dc.date.issued2017
dc.identifier.citationColadangelo, A, Goh, K.T, Scarani, V (2017). All pure bipartite entangled states can be self-tested. Nature Communications 8 : 15485. ScholarBank@NUS Repository. https://doi.org/10.1038/ncomms15485
dc.identifier.issn2041-1723
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/174425
dc.description.abstractQuantum technologies promise advantages over their classical counterparts in the fields of computation, security and sensing. It is thus desirable that classical users are able to obtain guarantees on quantum devices, even without any knowledge of their inner workings. That such classical certification is possible at all is remarkable: It is a consequence of the violation of Bell inequalities by entangled quantum systems. Device-independent self-testing refers to the most complete such certification: It enables a classical user to uniquely identify the quantum state shared by uncharacterized devices by simply inspecting the correlations of measurement outcomes. Self-testing was first demonstrated for the singlet state and a few other examples of self-testable states were reported in recent years. Here, we address the long-standing open question of whether every pure bipartite entangled state is self-testable. We answer it affirmatively by providing explicit self-testing correlations for all such states. © 2017 Japan Antibiotics Research Association All rights reserved.
dc.publisherNature Publishing Group
dc.sourceUnpaywall 20200831
dc.subjectcertification
dc.subjectcomputer simulation
dc.subjectquantum mechanics
dc.subjecttesting method
dc.subjectcertification
dc.subjectintermethod comparison
dc.subjectself evaluation
dc.typeArticle
dc.contributor.departmentELECTRICAL AND COMPUTER ENGINEERING
dc.contributor.departmentPHYSICS
dc.description.doi10.1038/ncomms15485
dc.description.sourcetitleNature Communications
dc.description.volume8
dc.description.page15485
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